| Silicon MEMS Reliability and Resilience |
Presentations |
| Performance Comparison: Silicon MEMS Verses Quartz Oscillators |
Presentations |
| How to Measure Clock Jitter in Precision Timing Applications |
Presentations |
| How to Measure Phase Jitter and Phase Noise in Precision Timing Applications |
Presentations |
| Silicon MEMS vs Quartz Supply Chain |
Presentations |
| Elite Super-TCXOs for GNSS Applications (Chinese) |
Product Briefs |
| Elite Platform MEMS Super-TCXOs and Oscillators FAQs (S. Chinese) |
FAQs |
| Elite Platform MEMS Super-TCXOs and Oscillators FAQs (T. Chinese) |
FAQs |
| Elite Platform MEMS Super-TCXOs and Oscillators FAQs (Korean) |
FAQs |
| Elite Platform MEMS Super-TCXOs and Oscillators FAQs |
FAQs |
| Elite Platform - Transforming the Telecom and Networking Timing Market (Korean) |
Presentations |
| Elite Platform - Transforming the Telecom and Networking Timing Market (S. Chinese) |
Presentations |
| Elite Platform - Transforming the Telecom and Networking Timing Market (T. Chinese) |
Presentations |
| Elite Platform - Transforming the Telecom and Networking Timing Market |
Presentations |
| Elite Precision Super-TCXOs for 5G, Small Cell and Time Synchronization (Chinese) |
Product Briefs |
| Elite Precision Super-TCXOs for 5G, Small Cell and Time Synchronization (Japanese) |
Product Briefs |
| MEMS-Based Resonators and Oscillators are Now Replacing Quartz |
Presentations |
| Getting In Touch with MEMS: The Electromechanical Interface |
Presentations |
| 坐5156 Datasheet |
Datasheets |
| J-AN10002 シングルエンド発振器の推奨終端方法 |
Application Notes |
| AN10002 Termination Recommendations for Single-ended Oscillator Driving Single or Multiple Loads |
Application Notes |
| J-AN10006 発振器のPCBデザインのガイドライン |
Application Notes |
| AN10006 Best Design and Layout Practices |
Application Notes |
| AN10007 Clock Jitter Definitions and Measurement Methods |
Application Notes |
| J-AN10007 クロックジッタの定義と測定方法 |
Application Notes |
| 坐ime発振器の信頼性計算方法 |
Technology Papers |
| AN10025 Reliability Calculations for SiTime Oscillators |
Application Notes |
| J-AN10028 プローブを使用した発振器の出力波形計測方法 |
Application Notes |
| AN10028 Probing Oscillator Output |
Application Notes |
| MEMSおよび水晶ベース発振器の電磁場感受率の比較 |
Technology Papers |
| Electromagnetic Susceptibility Comparison of MEMS and Quartz-based Oscillators |
Technology Papers |
| MEMS発振器と水晶発振器の性能比較(耐衝撃と耐振動) |
Technology Papers |
| Shock and Vibration Comparison of MEMS and Quartz-based Oscillators |
Technology Papers |
| J-AN10033 発振器の周波数測定ガイドライン |
Application Notes |
| AN10033 Frequency Measurement Guidelines for Oscillators |
Application Notes |
| J-AN10039 TCXOの周波数安定性および周波数精度バジェット |
Application Notes |
| AN10039 TCXO Frequency Stability and Frequency Accuracy Budget |
Application Notes |
| シリコンMEMS発振器の耐性および信頼性 |
Technology Papers |
| Resilience and Reliability of Silicon MEMS Oscillators |
Technology Papers |
| 坐imeの MEMS First™ プロセス技術 |
Technology Papers |
| 坐ime's MEMS First™ and EpiSeal™ Processes |
Technology Papers |
| MEMS Resonator Advantages - How MEMS Resonators Work Part 2 |
Presentations |
| How to Measure Long-term Jitter and Cycle-to-cycle Jitter in Precision Timing Applications |
Presentations |
| Silicon MEMS Oscillator Frequency Characteristics and Measurement Techniques |
Presentations |
| Synchronization System Performance Benefits of Precision MEMS TCXOs under Environmental Stress Conditions |
Technology Papers |
| 坐6911EB Interposer Boards User Manual |
User Manuals |
| 坐6722EB Evaluation Board User Manual |
User Manuals |
| AN10052 IEEE 1588 Precision Time Protocol (PTP) in ITU-T Standards |
Application Notes |
| Elite Super-TCXOs for GNSS Applications |
Product Briefs |
| Elite Precision Super-TCXOs for 5G, Small Cell and Time Synchronization |
Product Briefs |
| DualMEMS and TurboCompensation Temperature Sensing Technology |
Technology Papers |
| SC-AN10007 时钟抖动定义与测量方法 |
Application Notes |
| SC-AN10033 振荡器频率测量指南 |
Application Notes |
| 坐5156 10.949297MHz LVCMOS |
Freq. Test Reports |
| 坐5156 10MHz LVCMOS |
Freq. Test Reports |
| 坐5156 12.288MHz LVCMOS |
Freq. Test Reports |
| 坐5156 16.368MHz LVCMOS |
Freq. Test Reports |
| 坐5156 16.369MHz LVCMOS |
Freq. Test Reports |
| 坐5156 16.384MHz LVCMOS |
Freq. Test Reports |
| 坐5156 16.3676MHz LVCMOS |
Freq. Test Reports |
| 坐5156 16.367667MHz LVCMOS |
Freq. Test Reports |
| 坐5156 19.2MHz LVCMOS |
Freq. Test Reports |
| 坐5156 20MHz LVCMOS |
Freq. Test Reports |
| 坐5156 24.576MHz LVCMOS |
Freq. Test Reports |
| 坐5156 24.5535MHz LVCMOS |
Freq. Test Reports |
| 坐5156 24MHz LVCMOS |
Freq. Test Reports |
| 坐5156 25MHz LVCMOS |
Freq. Test Reports |
| 坐5156 26MHz LVCMOS |
Freq. Test Reports |
| 坐5156 30.72MHz LVCMOS |
Freq. Test Reports |
| 坐5156 38.4MHz LVCMOS |
Freq. Test Reports |
| 坐5156 38.88MHz LVCMOS |
Freq. Test Reports |
| 坐5156 40MHz LVCMOS |
Freq. Test Reports |
| 坐5156 10.949297MHz Clipped Sinewave |
Freq. Test Reports |
| 坐5156 10MHz Clipped Sinewave |
Freq. Test Reports |
| 坐5156 12.288MHz Clipped Sinewave |
Freq. Test Reports |
| 坐5156 16.368MHz Clipped Sinewave |
Freq. Test Reports |
| 坐5156 16.369MHz Clipped Sinewave |
Freq. Test Reports |
| 坐5156 16.384MHz Clipped Sinewave |
Freq. Test Reports |
| 坐5156 16.3676MHz Clipped Sinewave |
Freq. Test Reports |
| 坐5156 16.367667MHz Clipped Sinewave |
Freq. Test Reports |
| 坐5156 19.2MHz Clipped Sinewave |
Freq. Test Reports |
| 坐5156 20MHz Clipped Sinewave |
Freq. Test Reports |
| 坐5156 24.576MHz Clipped Sinewave |
Freq. Test Reports |
| 坐5156 24.5535MHz Clipped Sinewave |
Freq. Test Reports |
| 坐5156 24MHz Clipped Sinewave |
Freq. Test Reports |
| 坐5156 25MHz Clipped Sinewave |
Freq. Test Reports |
| 坐5156 26MHz Clipped Sinewave |
Freq. Test Reports |
| 坐5156 30.72MHz Clipped Sinewave |
Freq. Test Reports |
| 坐5156 38.4MHz Clipped Sinewave |
Freq. Test Reports |
| 坐5156 38.88MHz Clipped Sinewave |
Freq. Test Reports |
| 坐5156 40MHz Clipped Sinewave |
Freq. Test Reports |
| Timing Solutions for Communications & Enterprise |
Brochures/Fliers |
| AN10063 TCXO and OCXO Stability Degradation |
Application Notes |
| Phase Noise Measurement Tutorial |
Videos |
| Whack an Oscillator Demo |
Videos |
| 坐5156 (LVCMOS, 3.3 V) |
IBIS Models |
| 坐5156 (LVCMOS, 2.5 V) |
IBIS Models |
| 坐5156 (CSINE, 3.3 V) |
IBIS Models |
| 坐5156 (CSINE, 2.5 V) |
IBIS Models |
| PCI Express Refclk Jitter Compliance using a Phase Noise Analyzer |
Presentations |
| AN10064 Improved System Performance with Digital Frequency Tuning in Precision Super-TCXOs |
Application Notes |
| 坐6702DM Demo Board User Manual |
User Manuals |
| Advantages of MEMS Timing - Parameters |
Videos |
| Elite Super-TCXO Improves GNSS Robustness |
Videos |
| Elite Super-TCXO Improves Performance of IEEE 1588 Applications |
Videos |
| 坐ime MEMS Oscillators - Revolutionizing the Timing Market |
Videos |
| Network Evolution 5G - Timing and Synchronization |
Videos |
| Ceramic 5032 10-Pins |
3D Step Models |
| 坐6702DM Demo Board Quick Start Guide |
User Manuals |
| How to Design with SiTime TCXOs and OCXOs |
Videos |
| Timing Solutions for Industrial |
Brochures/Fliers |
| Elite Precision Super-TCXOs Solve Networking and Telecom Timing Issues |
Videos |
| 坐ime MEMS Timing Solutions for Servers |
Videos |
| 坐ime MEMS First 工艺 |
Technology Papers |
| AN10073 How to Setup a Real-time Oscilloscope to Measure Jitter |
Application Notes |
| AN10071 Computing TIE Crest Factors for Telecom Applications |
Application Notes |
| AN10070 Computing TIE Crest Factors for Non-telecom Applications |
Application Notes |
| AN10072确定阶段随机过程的主要来源se, by Inspection |
Application Notes |
| AN10074 Removing Oscilloscope Noise from RMS Jitter Measurements |
Application Notes |