SiT9367AC-2C2-33E644.531250

Device Type Differential Oscillators
Frequency
644.53125 MHz
Frequency Stability (ppm)
25
Operating Temp. Range (°C)
-20 to 70
Output Type
LVDS
Supply Voltage (V)
3.30
Package Size (mm x mm)
5.0x3.2
Package Height (mm)
0.75
Output Drive Strength*
n/a
Feature Pin
OE
Pull Range (PPM PR)
n/a
Spread Percentage
n/a
Swing Select
n/a
DC-Coupled Output VOL or AC Swing
n/a
DC-Coupled Output VOH
n/a
RoHS
Yes

*See datasheet for details

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Tape & Reel Options
T = 3,000 ct
X = 1,500 ct
Y = 250 ct

Exceptional dynamic performance in real-life operating conditions

  • 0.23 ps jitter (typ.)
  • ±10 ppm: Ensures best system performance in hostile environments;

20x better vibration sensitivity

  • Minimizes packet loss in high-vibration environments

0.05 ps/mV power supply noise rejection (PSNR)

  • Simplify power supply design

3.2 x 2.5 mm package

  • Enables small form-factor system with stringent jitter requirement

Flexible programmable features

  • 220 to 725 MHz
  • 2.25 to 3.63 V
  • LVPECL, LVDS, HCSL: Customized oscillator specifications for optimal system performance;

Superior reliability

  • 1 billion hours MTBF
  • Lifetime warranty: Reduces field failures due to clock components and associated repair costs
  • 10G to 100G Ethernet
  • Optical modules
  • PCIe
  • FPGA
  • SATA/SAS
  • Fibre channel
  • System clocking
  • Serial-data links
  • Wireless & backhaul
  • Fiber, cable, DSL
  • Security appliances
  • Data centers

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Eval Boards(Contact SiTime)– SiT6097 (3225) | SiT6085 (7050)

Frequency Slope (dF/dT) Calculator– Calculate frequency slope over temperature

Jitter Calculator and Plots– Convert phase noise to phase jitter, find phase noise plots

Reliability Calculator– Get FIT/MTBF data for various operating conditions

3225 6-Pins|5032 6-Pins with CP|7050 6-Pins with CP– Preview packages with QFN3D step models

Narrow By:

Resource Name Type
Silicon MEMS Reliability and Resilience Presentations
Performance Comparison: Silicon MEMS Verses Quartz Oscillators Presentations
How to Measure Clock Jitter in Precision Timing Applications Presentations
How to Measure Phase Jitter and Phase Noise in Precision Timing Applications Presentations
Silicon MEMS vs Quartz Supply Chain Presentations
Elite Platform MEMS Super-TCXOs and Oscillators FAQs (S. Chinese) FAQs
Elite Platform MEMS Super-TCXOs and Oscillators FAQs (T. Chinese) FAQs
Elite Platform MEMS Super-TCXOs and Oscillators FAQs (Korean) FAQs
Elite Platform MEMS Super-TCXOs and Oscillators FAQs FAQs
Elite Platform - Transforming the Telecom and Networking Timing Market (Korean) Presentations
Elite Platform - Transforming the Telecom and Networking Timing Market (S. Chinese) Presentations
Elite Platform - Transforming the Telecom and Networking Timing Market (T. Chinese) Presentations
Elite Platform - Transforming the Telecom and Networking Timing Market Presentations
Elite Precision Super-TCXOs for 5G, Small Cell and Time Synchronization (Chinese) Product Briefs
Elite Precision Super-TCXOs for 5G, Small Cell and Time Synchronization (Japanese) Product Briefs
MEMS oscillators improve reliability and system performance in motor control applications White Papers
MEMS-Based Resonators and Oscillators are Now Replacing Quartz Presentations
Getting In Touch with MEMS: The Electromechanical Interface Presentations
SiT9367 Datasheet Datasheets
J-AN10006 発振器のPCBデザインのガイドライン Application Notes
AN10007 Clock Jitter Definitions and Measurement Methods Application Notes
J-AN10007 クロックジッタの定義と測定方法 Application Notes
SiTime発振器の信頼性計算方法 Technology Papers
J-AN10028 プローブを使用した発振器の出力波形計測方法 Application Notes
MEMSおよび水晶ベース発振器の電磁場感受率の比較 Technology Papers
Electromagnetic Susceptibility Comparison of MEMS and Quartz-based Oscillators Technology Papers
MEMS発振器と水晶発振器の性能比較(耐衝撃と耐振動) Technology Papers
Shock and Vibration Comparison of MEMS and Quartz-based Oscillators Technology Papers
J-AN10033 発振器の周波数測定ガイドライン Application Notes
シリコンMEMS発振器の耐性および信頼性 Technology Papers
Resilience and Reliability of Silicon MEMS Oscillators Technology Papers
SiTimeの MEMS First™ プロセス技術 Technology Papers
MEMS Resonator Advantages - How MEMS Resonators Work Part 2 Presentations
How to Measure Long-term Jitter and Cycle-to-cycle Jitter in Precision Timing Applications Presentations
Silicon MEMS Oscillator Frequency Characteristics and Measurement Techniques Presentations
SiT9367 250MHz HCSL Freq. Test Reports
SiT9367 300MHz HCSL Freq. Test Reports
SiT9367 322.265625MHz HCSL Freq. Test Reports
SiT9367 325MHz HCSL Freq. Test Reports
SiT9367 250MHz LVDS Freq. Test Reports
SiT9367 300MHz LVDS Freq. Test Reports
SiT9367 322.265625MHz LVDS Freq. Test Reports
SiT9367 325MHz LVDS Freq. Test Reports
SiT9367 250MHz LVPECL Freq. Test Reports
SiT9367 300MHz LVPECL Freq. Test Reports
SiT9367 322.265625MHz LVPECL Freq. Test Reports
SiT9367 325 mhz LVPECL Freq. Test Reports
AN10029 Output Terminations for Differential Oscillators Application Notes
Elite Precision Super-TCXOs for 5G, Small Cell and Time Synchronization Product Briefs
DualMEMS and TurboCompensation Temperature Sensing Technology Technology Papers
AN10061 Inphi PAM4 Performance when Driving Shared Reference Clocks Application Notes
SC-AN10007 时钟抖动定义与测量方法 Application Notes
Timing Solutions for Communications & Enterprise Brochures/Fliers
SiT9367 (HCSL, 3.3 V) IBIS Models
SiT9367 (HCSL, 2.5 V) IBIS Models
SiT9367 (LVDS, 3.3 V) IBIS Models
SiT9367 (LVDS, 2.5 V) IBIS Models
SiT9367 (LVPECL, 3.3 V) IBIS Models
SiT9367 (LVPECL, 2.5 V) IBIS Models
Advantages of MEMS Timing - Parameters Videos
SiTime MEMS Oscillators - Revolutionizing the Timing Market Videos
Jitter Part 1: Principles and Practice with an Overview of Period Jitter Videos
Jitter Part 2: Phase Noise and Phase Jitter Videos
Jitter Part 3: C2C Jitter and Long Term Jitter Videos
QFN 3225 6-Pins 3D Step Models
QFN 5032 6-Pins with CP 3D Step Models
QFN 7050 6-Pins with CP 3D Step Models
AN10066 LVDS Output with 600 mV to 1200 mV Swing Application Notes
Timing Solutions for Industrial Brochures/Fliers
Smart Network Interface Card (NIC) and IEEE1588 Application Briefs
100G/200G/400G/800G Optical Modules Application Briefs
SiTime MEMS Timing Solutions for Optical Module Videos
Fronthaul and IP RAN Switches Application Briefs
SiTime MEMS Timing Solutions for Servers Videos
SiTime MEMS First 工艺 Technology Papers
AN10073 How to Setup a Real-time Oscilloscope to Measure Jitter Application Notes
AN10071 Computing TIE Crest Factors for Telecom Applications Application Notes
AN10070 Computing TIE Crest Factors for Non-telecom Applications Application Notes
AN10072 Determine the Dominant Source of Phase Noise, by Inspection Application Notes
AN10074 Removing Oscilloscope Noise from RMS Jitter Measurements Application Notes