SIT2018 7.3728MHz LVCMOS.GydF4y2Ba |
弗里克。测试报告GydF4y2Ba |
SIT2018 8.192MHz LVCMOS.GydF4y2Ba |
弗里克。测试报告GydF4y2Ba |
SIT20188MHz LVCMOS |
弗里克。测试报告GydF4y2Ba |
SIT20189.8304MHz LVCMOS |
弗里克。测试报告GydF4y2Ba |
SIT2018 9.84375MHz LVCMOS.GydF4y2Ba |
弗里克。测试报告GydF4y2Ba |
SIT201811.0592MHz LVCMOS |
弗里克。测试报告GydF4y2Ba |
SIT201812.288MHz LVCMOS |
弗里克。测试报告GydF4y2Ba |
SIT2018 12MHz LVCMOS.GydF4y2Ba |
弗里克。测试报告GydF4y2Ba |
SIT201813.52127MHz LVCMOS |
弗里克。测试报告GydF4y2Ba |
SIT201813.225625MHz LVCMOS |
弗里克。测试报告GydF4y2Ba |
SIT201814.7456MHz LVCMOS |
弗里克。测试报告GydF4y2Ba |
SIT2018 14.31818MHz LVCMOS.GydF4y2Ba |
弗里克。测试报告GydF4y2Ba |
SIT201815MHz LVCMOS |
弗里克。测试报告GydF4y2Ba |
SIT2018 16.384MHz LVCMOS.GydF4y2Ba |
弗里克。测试报告GydF4y2Ba |
SIT201818.432MHz LVCMOS |
弗里克。测试报告GydF4y2Ba |
SIT201819.6608MHz LVCMOS |
弗里克。测试报告GydF4y2Ba |
SIT201820MHz LVCMOS |
弗里克。测试报告GydF4y2Ba |
SIT201822.1184MHz LVCMOS |
弗里克。测试报告GydF4y2Ba |
SIT201824.56MHz LVCMOS |
弗里克。测试报告GydF4y2Ba |
SIT201824.576MHz LVCMOS |
弗里克。测试报告GydF4y2Ba |
SIT201824MHz LVCMOS |
弗里克。测试报告GydF4y2Ba |
SIT2018 25MHz LVCMOS.GydF4y2Ba |
弗里克。测试报告GydF4y2Ba |
SIT201826MHz LVCMOS |
弗里克。测试报告GydF4y2Ba |
SIT201827MHz LVCMOS |
弗里克。测试报告GydF4y2Ba |
SIT201829.4912MHz LVCMOS |
弗里克。测试报告GydF4y2Ba |
SIT2018 32MHz LVCMOS.GydF4y2Ba |
弗里克。测试报告GydF4y2Ba |
SIT201833MHz LVCMOS |
弗里克。测试报告GydF4y2Ba |
SIT2018 36MHz LVCMOS.GydF4y2Ba |
弗里克。测试报告GydF4y2Ba |
SIT201840MHz LVCMOS |
弗里克。测试报告GydF4y2Ba |
SIT201848MHz LVCMOS |
弗里克。测试报告GydF4y2Ba |
SIT201850MHz LVCMOS |
弗里克。测试报告GydF4y2Ba |
SIT201854MHz LVCMOS |
弗里克。测试报告GydF4y2Ba |
SIT201862.5MHz LVCMOS |
弗里克。测试报告GydF4y2Ba |
SIT201865MHz LVCMOS |
弗里克。测试报告GydF4y2Ba |
SiT2018 72 mhz LVCMOSGydF4y2Ba |
弗里克。测试报告GydF4y2Ba |
SIT2018 74.25MHz LVCMOS.GydF4y2Ba |
弗里克。测试报告GydF4y2Ba |
SIT2018 74.176MHz LVCMOS.GydF4y2Ba |
弗里克。测试报告GydF4y2Ba |
SIT2018 75MHz LVCMOS.GydF4y2Ba |
弗里克。测试报告GydF4y2Ba |
SIT201877.76MHz LVCMOS |
弗里克。测试报告GydF4y2Ba |
SIT2018100MHz LVCMOS |
弗里克。测试报告GydF4y2Ba |
SIT2018(LVCMOS,1.8 V)GydF4y2Ba |
IBIS Models |
SIT2018(LVCMOS,2.5 V)GydF4y2Ba |
IBIS Models |
SIT2018(LVCMOS, 2.8 V) |
IBIS Models |
SIT2018(LVCMOS, 3.0 V) |
IBIS Models |
SIT2018(LVCMOS, 3.3 V) |
IBIS Models |
SIT2018(2.25 to 3.63 V) |
IBIS Models |
硅MEMS可靠性和弹性GydF4y2Ba |
Presentations |
Performance Comparison: Silicon MEMS Verses Quartz Oscillators |
Presentations |
MEMS Oscillators Enhance Clock Performance in Industrial and Hi-Reliability Applications |
Presentations |
How to Measure Clock Jitter in Precision Timing Applications |
Presentations |
How to Measure Phase Jitter and Phase Noise in Precision Timing Applications |
Presentations |
How to Get Instant Oscillators with SiTime's New Field Programmer |
Presentations |
Silicon MEMS vs Quartz Supply Chain |
Presentations |
硅MEMS振荡器为LED照明提供了益处GydF4y2Ba |
White Papers |
MEMS定时解决方案改进触摸屏设备GydF4y2Ba |
White Papers |
Field Programmable Timing Solutions for Medical Applications |
White Papers |
Ultra-robust MEMS timing solutions improve performance and reliability in meter applications |
White Papers |
MEMS oscillators improve reliability and system performance in motor control applications |
White Papers |
MEMS-Based Resonators and Oscillators are Now Replacing Quartz |
Presentations |
Getting In Touch with MEMS: The Electromechanical Interface |
Presentations |
Field Programmable Oscillators Datasheet |
数据表s |
SIT2018B Datasheet |
数据表s |
Time Machine II MEMS Oscillator Programmer |
Product Briefs |
J-AN10002シングルエンドシングルエンド器材のの推奨方法GydF4y2Ba |
申请笔记GydF4y2Ba |
AN10002 Termination Recommendations for Single-ended Oscillator Driving Single or Multiple Loads |
申请笔记GydF4y2Ba |
J-AN10006 発振器のPCBデザインのガイドライン |
申请笔记GydF4y2Ba |
AN10006最佳设计和布局实践GydF4y2Ba |
申请笔记GydF4y2Ba |
AN10007 Clock Jitter Definitions and Measurement Methods |
申请笔记GydF4y2Ba |
J-AN10007 クロックジッタの定義と測定方法 |
申请笔记GydF4y2Ba |
SiTime発振器の信頼性計算方法 |
Technology Papers |
AN10025 Reliability Calculations for SiTime Oscillators |
申请笔记GydF4y2Ba |
J-AN10028プローブプローブ使使使しししたのの波形波形计测方法GydF4y2Ba |
申请笔记GydF4y2Ba |
AN10028 Probing Oscillator Output |
申请笔记GydF4y2Ba |
MEMSおよび水晶ベース発振器の電磁場感受率の比較 |
Technology Papers |
基于MEMS和石英振荡器的电磁敏感性比较GydF4y2Ba |
Technology Papers |
MEMS発振器材と水晶仪器のの比较(耐冲撃と移动)GydF4y2Ba |
Technology Papers |
基于MEMS和石英振荡器的冲击和振动比较GydF4y2Ba |
Technology Papers |
J-AN10033 発振器の周波数測定ガイドライン |
申请笔记GydF4y2Ba |
AN10033 Frequency Measurement Guidelines for Oscillators |
申请笔记GydF4y2Ba |
シリコンMEMS発振器の耐性および信頼性 |
Technology Papers |
Resilience and Reliability of Silicon MEMS Oscillators |
Technology Papers |
SITIMEのMEMS FIRST™プロセス技术GydF4y2Ba |
Technology Papers |
stime的MEMS First™和Episeal™流程GydF4y2Ba |
Technology Papers |
The top 8 reasons to use an oscillator instead of a crystal resonator |
White Papers |
MEMS Resonator Advantages - How MEMS Resonators Work Part 2 |
Presentations |
How to Measure Long-term Jitter and Cycle-to-cycle Jitter in Precision Timing Applications |
Presentations |
Silicon MEMS Oscillator Frequency Characteristics and Measurement Techniques |
Presentations |
AN10052 IEEE 1588 Precision Time Protocol (PTP) in ITU-T Standards |
申请笔记GydF4y2Ba |
SC-AN10007 时钟抖动定义与测量方法 |
申请笔记GydF4y2Ba |
SC-AN10033振荡频率销量江南GydF4y2Ba |
申请笔记GydF4y2Ba |
AN10062振荡器相位噪声测量指南GydF4y2Ba |
申请笔记GydF4y2Ba |
Phase Noise Measurement Tutorial |
Videos |
PCI使用相位噪声分析仪表达REFCLK抖动符合性GydF4y2Ba |
Presentations |
Advantages of MEMS Timing - Parameters |
Videos |
SINIME MEMS振荡器 - 彻底改变定时市场GydF4y2Ba |
Videos |
SiTime's Time Machine II - Part 1: How to Install Oscillator Programming Software |
Videos |
环境机器II - 第2部分:如何编程现场可编程振荡器GydF4y2Ba |
Videos |
SOT 23 5-Pins |
3D步骤模型GydF4y2Ba |
SiTime MEMS Timing Solutions (8.5x11) |
Brochures/Fliers |
SiTime MEMS Timing Solutions (A4) |
Brochures/Fliers |
SiTime MEMS Timing Solutions (A4) Chinese |
Brochures/Fliers |
Timing Solutions for Industrial |
Brochures/Fliers |
Silicon Replaces Quartz (Japanese Subtitles) |
Videos |
硅取代石英(中文字幕)GydF4y2Ba |
Videos |
SiTime MEMS First 工艺 |
Technology Papers |
AN10073 How to Setup a Real-time Oscilloscope to Measure Jitter |
申请笔记GydF4y2Ba |
AN10071计算领带电信应用因素GydF4y2Ba |
申请笔记GydF4y2Ba |
AN10070 Computing TIE Crest Factors for Non-telecom Applications |
申请笔记GydF4y2Ba |
AN10072 Determine the Dominant Source of Phase Noise, by Inspection |
申请笔记GydF4y2Ba |
AN10074从RMS抖动测量中移除示波器噪声GydF4y2Ba |
申请笔记GydF4y2Ba |