SiT2018BE-S8-33N-12.000000

SiT2018BE-S8-33N-12.000000

Device Type 汽车和高温振荡器
Frequency
12 MHz
Frequency Stability (ppm)
±30
Operating Temp. Range (°C)
-40 to 105
Output Type
LVCMOS
电源电压(V)
3.3
Package Size (mm x mm)
SOT23(2.9x2.8)
Package Height (mm)
1.45
Output Drive Strength*
Default
Feature Pin
No Connect
RoHS
Yes

*See datasheet for details

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Tape & Reel Options
D = 3,000 ct
E = 1,000
G = 250 ct

±20 ppm over automotive temp. (-40 to +125 °C)

  • Better timing margin ideal for outdoor and high-temp. operating environment

Configurable feature sets

  • Any frequency between 1 - 110 MHz with 6 decimal places of accuracy
  • 1.8 V or 2.5 V to 3.3 V supply voltage
  • Customize specification for optimal system performance
  • Use same base device for many design, reducing qualification needs

0.1 ppb/glow g-sensitivity

  • Improved system performance under vibration
  • Carrier drop-test compliance (STB, etc.);

70gvibration and 50,000gshock

  • Best system reliability in harsh environments;

FlexEdge™ rise/fall time

  • Optimize EMI to reduce interference to other subsystems;

SOT23-5 package

  • 最佳板级焊点可靠性
  • Easy, low-cost, optical-only, board-level inspection of solder joints;

Ultra-fast lead time (4 to 6 weeks)

  • Reduce inventory overhead
  • 缓解短缺风险

  • Engine & transmission ECUs
  • XTAL replacement
  • ADAS computer
  • Automotive cameras
  • Infotainment
  • Precision GNSS
  • GPS/GNSS modules
  • Power & energy
  • Railroads

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Evaluation Board(Contact SiTime)– SiT6097 (2928 SOT23-5)

Time Machine II Programmer– Program frequency, voltage, stability & more

Frequency Slope (dF/dT) Calculator–计算温度下的频率斜率

Reliability Calculator– Get FIT/MTBF data for various operating conditions

SOT 23 5针3D Step Model– Preview oscillator packages in 3D

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Resource Name Type
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SiT201815MHz LVCMOS Freq. Test Reports
SiT201816.384MHz LVCMOS Freq. Test Reports
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SiT201833MHz LVCMOS Freq. Test Reports
SiT201836MHz LVCMOS Freq. Test Reports
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SiT201848MHz LVCMOS Freq. Test Reports
SiT201850MHz LVCMOS Freq. Test Reports
SiT201854MHz LVCMOS Freq. Test Reports
SiT201862.5MHz LVCMOS Freq. Test Reports
SiT201865MHz LVCMOS Freq. Test Reports
SiT201872MHz LVCMOS Freq. Test Reports
SiT201874.25MHz LVCMOS Freq. Test Reports
SiT201874.176MHz LVCMOS Freq. Test Reports
SiT201875MHz LVCMOS Freq. Test Reports
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SiT2018100MHz LVCMOS Freq. Test Reports
SiT2018(LVCMOS, 1.8 V) IBIS Models
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SiT2018(LVCMOS, 2.8 V) IBIS Models
SiT2018(LVCMOS, 3.0 V) IBIS Models
SiT2018(LVCMOS, 3.3 V) IBIS Models
SiT2018(2.25 to 3.63 V) IBIS Models
Silicon MEMS Reliability and Resilience Presentations
Performance Comparison: Silicon MEMS Verses Quartz Oscillators Presentations
MEMS Oscillators Enhance Clock Performance in Industrial and Hi-Reliability Applications Presentations
How to Measure Clock Jitter in Precision Timing Applications Presentations
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How to Get Instant Oscillators with SiTime's New Field Programmer Presentations
Silicon MEMS vs Quartz Supply Chain Presentations
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MEMS-Based Resonators and Oscillators are Now Replacing Quartz Presentations
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Field Programmable Oscillators Datasheet 数据表
SiT2018B Datasheet 数据表
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J-AN10002 シングルエンド発振器の推奨終端方法 Application Notes
AN10002 Termination Recommendations for Single-ended Oscillator Driving Single or Multiple Loads Application Notes
J-AN10006 発振器のPCBデザインのガイドライン Application Notes
AN10006 Best Design and Layout Practices Application Notes
AN10007 Clock Jitter Definitions and Measurement Methods Application Notes
J-AN10007 クロックジッタの定義と測定方法 Application Notes
坐ime発振器の信頼性計算方法 Technology Papers
AN10025 Reliability Calculations for SiTime Oscillators Application Notes
J-AN10028 プローブを使用した発振器の出力波形計測方法 Application Notes
AN10028 Probing Oscillator Output Application Notes
MEMSおよび水晶ベース発振器の電磁場感受率の比較 Technology Papers
Electromagnetic Susceptibility Comparison of MEMS and Quartz-based Oscillators Technology Papers
MEMS発振器と水晶発振器の性能比較(耐衝撃と耐振動) Technology Papers
Shock and Vibration Comparison of MEMS and Quartz-based Oscillators Technology Papers
J-AN10033 発振器の周波数測定ガイドライン Application Notes
AN10033 Frequency Measurement Guidelines for Oscillators Application Notes
シリコンMEMS発振器の耐性および信頼性 Technology Papers
Resilience and Reliability of Silicon MEMS Oscillators Technology Papers
坐imeの MEMS First™ プロセス技術 Technology Papers
坐ime's MEMS First™ and EpiSeal™ Processes Technology Papers
The top 8 reasons to use an oscillator instead of a crystal resonator White Papers
MEMS Resonator Advantages - How MEMS Resonators Work Part 2 Presentations
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Silicon MEMS Oscillator Frequency Characteristics and Measurement Techniques Presentations
AN10052 IEEE 1588 Precision Time Protocol (PTP) in ITU-T Standards Application Notes
SC-AN10007 时钟抖动定义与测量方法 Application Notes
SC-AN10033 振荡器频率测量指南 Application Notes
AN10062 Phase Noise Measurement Guide for Oscillators Application Notes
Phase Noise Measurement Tutorial 视频
PCI Express Refclk Jitter Compliance using a Phase Noise Analyzer Presentations
Advantages of MEMS Timing - Parameters 视频
坐ime MEMS Oscillators - Revolutionizing the Timing Market 视频
SiTime第二时间机器——第1部分:如何安装Oscillator Programming Software 视频
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SOT 23 5针 3D Step Models
坐ime MEMS Timing Solutions (8.5x11) Brochures/Fliers
SiTime MEMS定时解决方案(A4) Brochures/Fliers
SiTime MEMS定时解决方案(A4)Chinese Brochures/Fliers
Timing Solutions for Industrial Brochures/Fliers
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AN10071 Computing TIE Crest Factors for Telecom Applications Application Notes
AN10070 Computing TIE Crest Factors for Non-telecom Applications Application Notes
AN10072 Determine the Dominant Source of Phase Noise, by Inspection Application Notes
AN10074 Removing Oscilloscope Noise from RMS Jitter Measurements Application Notes