坐1618BA-13-33S-25.000000

坐1618BA-13-33S-25.000000

Device Type Automotive & High Temp Oscillators
Frequency
25 MHz
Frequency Stability (ppm)
50
Operating Temp. Range (°C)
-40 to 125
Output Type
LVCMOS
Supply Voltage (V)
3.30
Package Size (mm x mm)
2.5x2.0
Package Height (mm)
0.75
Output Drive Strength*
Default
Feature Pin
Standby
Pull Range (PPM PR)
n/a
Spread Percentage
n/a
Swing Select
n/a
DC-Coupled Output VOL or AC Swing
n/a
DC-Coupled Output VOH
n/a
RoHS
Yes

*See datasheet for details

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Tape & Reel Options
D = 3,000 ct
E = 1,000
G = 250 ct

±20 ppm over automotive temp. (-40 to 125 °C)

  • Better timing margin ideal for outdoor and high-temp operating environment

Configurable feature sets

  • 33 standard frequencies between 7.3728 MHz and 48 MHz
  • 1.8 V or 2.5 V to 3.3 V supply voltage:
  • Customize specification for optimal system performance
  • Use same base device for many designs reducing qualification needs

0.1 ppb/g low g-sensitivity

  • 改善系统性能在振动
  • Carrier drop-test compliance (STB, etc.)

70gvibration and 50,000gshock

  • Best system reliability in harsh environments
  • Fewer product failures

FlexEdge™ drive strength

  • Slower rise/fall time that minimizes EMI from the oscillator
  • Lower cost by driving multiple loads and eliminate additional timing components

5 industry-standard packages

  • 100% drop-in replacement of quartz crystal oscillators

Ultra-fast lead time (4 to 6 weeks)

  • Reduce inventory overhead
  • Mitigate shortage risks

  • Engine & transmission ECUs
  • XTAL replacement
  • ADAS computer
  • Automotive cameras
  • Infotainment

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Resource Name Type
坐1618 7.3728MHz LVCMOS Freq. Test Reports
坐1618 8MHz LVCMOS Freq. Test Reports
坐1618 9.84375MHz LVCMOS Freq. Test Reports
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坐1618 13.52127MHz LVCMOS Freq. Test Reports
坐1618 13.225625MHz LVCMOS Freq. Test Reports
坐1618 13MHz LVCMOS Freq. Test Reports
坐1618 15MHz LVCMOS Freq. Test Reports
坐1618 19.6608MHz LVCMOS Freq. Test Reports
坐1618 20MHz LVCMOS Freq. Test Reports
坐1618 22.1184MHz LVCMOS Freq. Test Reports
坐1618 24MHz LVCMOS Freq. Test Reports
坐1618 25MHz LVCMOS Freq. Test Reports
坐1618 26MHz LVCMOS Freq. Test Reports
坐1618 27MHz LVCMOS Freq. Test Reports
坐1618 30MHz LVCMOS Freq. Test Reports
坐1618 32MHz LVCMOS Freq. Test Reports
坐1618 36MHz LVCMOS Freq. Test Reports
坐1618 40MHz LVCMOS Freq. Test Reports
坐1618 48MHz LVCMOS Freq. Test Reports
坐1618 (LVCMOS, 1.8 V) IBIS Models
坐1618 (LVCMOS, 3.3 V) IBIS Models
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坐1618 Datasheet Datasheets
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AN10006 Best Design and Layout Practices Application Notes
AN10007 Clock Jitter Definitions and Measurement Methods Application Notes
J-AN10007 クロックジッタの定義と測定方法 Application Notes
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AN10025 Reliability Calculations for SiTime Oscillators Application Notes
J-AN10028 プローブを使用した発振器の出力波形計測方法 Application Notes
AN10028 Probing Oscillator Output Application Notes
MEMSおよび水晶ベース発振器の電磁場感受率の比較 Technology Papers
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AN10033 Frequency Measurement Guidelines for Oscillators Application Notes
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Silicon MEMS Oscillator Frequency Characteristics and Measurement Techniques Presentations
AN10052 IEEE 1588 Precision Time Protocol (PTP) in ITU-T Standards Application Notes
SC-AN10007 时钟抖动定义与测量方法 Application Notes
SC-AN10033 振荡器频率测量指南 Application Notes
AN10062 Phase Noise Measurement Guide for Oscillators Application Notes
Phase Noise Measurement Tutorial Videos
PCI Express Refclk Jitter Compliance using a Phase Noise Analyzer Presentations
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坐ime MEMS Oscillators - Revolutionizing the Timing Market Videos
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坐ime MEMS Timing Solutions (A4) Chinese Brochures/Fliers
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Silicon Replaces Quartz (Chinese Subtitles) Videos
坐ime MEMS First 工艺 Technology Papers
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AN10071 Computing TIE Crest Factors for Telecom Applications Application Notes
AN10070 Computing TIE Crest Factors for Non-telecom Applications Application Notes
AN10072 Determine the Dominant Source of Phase Noise, by Inspection Application Notes
AN10074 Removing Oscilloscope Noise from RMS Jitter Measurements Application Notes